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Syncro has developed a new measuring system based on Low Coherence interferometry (LCI) technology. The signal emitted by each border surface between two materials with different refraction index can give us info about the position of the layer who generate it. Knowing the refraction index of the different materials, discomposing and reworking the different reflected waves is possible to get the distance of all the levels so the absolute value of the distance between the different layers that compose the film.



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